1. Picosecond Photoemission Probing for High-Speed Integrated Circuits
   H. Beha and R. Clauberg
   in Electron Beam Testing Technology, ed. by J.T.L. Thong, Plenum Press, New York, 1993, pp. 289-313.
2. Photoemission and Bremsstrahlung from Fe and Ni: Theoretical Results and Analysis of Experimental Data
   R. Clauberg and R. Feder
   in Polarized Electrons in Surface Physics, ed. R. Feder, (World Scientific Publishing Co., Singapore, 1985, pp. 565-604).